18 eredmény a kulcsszóra: 'thin film growth'
— We have continued our research concerning the development of optical thin film structures containing nanooptically thin layers for advanced applications in
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The aim of the European joint research project for optoelectronic thin _lm characterization (IND07) in the European Metrology Research Programme of EURAMET is to
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In both cases, the whisker density reached very high numbers (~24 000 pcs./mm 2 ), but most of the whiskers formed in the less critical nodule-type in morphology.
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Keywords: quality by design; quality planning; initial risk assessment; critical factors; thermosensitive liposomes; thin-film hydration
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"elite" group. Yet the number of active referees for a journal can far exceed the number of active contributors. Lund- berg, that journal's list of active referees
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Bisztray Gyula : Új arcú magyar poéták.
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Three basic types of folds are associated with him: the Folds of Life (basic folds that introduced kids to paper folding), the Folds of Truth (teaching basic principles of
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As a result of analyzing the competitive role, the potential economic development effects and the economic-social environment of universities we can create the virtual model
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Végül sor került egy virtuális egyetemi modell ismertetésére, mely tartalmazza azon épít ő köveket, sikerességi faktorokat, melyek amellett, hogy
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Size-dependent structural parameters of the nanocrystalline structures (mainly the nanocrystal size, density and separation, and the thin film thickness and composition) were
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SYNTHESIS AND CHARACTERIZATION TIO 2 POWDERS AND THIN FILM OBTAINED BY SOLVOTHERMAL METHOD FOR APPLICATIONS IN ENVIRONMENT FRIENDLY BUILDING MATERIAL TECHNOLOGIES.. Florina
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Ennek érdekében egy új, átfogóbb indexet hozott létre a WEFORUM Global Competitiveness Index néven 2005-2006-ban, mely több pilléren nyugszik, és a szándékok szerint így
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In this study, the early stage whisker development from 2 μm thick vacuum evaporated Sn film on rough and polished Cu substrates were investigated.. It was found, that the
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The method provides thin areas at the fracture edges of plan-view specimens with thickness in the range of the grain size in the film allowing for artefact free
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The present paper is but the first of an intended series and it will be restricted to the simplest model: to a thin film of a wide gap semiconductor with
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(It is to be mentioned that all other stibnite specimens from the Epeijes-Tokaj Mountains, at least those known by us, consist of fine acicular aggregates.) A white, thin film
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The calculated reflectometric interference curves for (A) the conventional and (B) the polarization method, in the case of an n 1 = 1.21 and d = 110 nm thin film on fused
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Ágh Istvánnak Uram, neveld az olajfákat Időre odaérek én is.. Kétfelől
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